Pierre is a principal analyst in the Photonics and Display division of Yole Developpement. Pierre’s focuses on imaging technologies and markets and provides market and technology analyses along with strategy consulting services to semiconductor companies. He is the author of more than 15 market and technology reports and is responsible for Yole’s CMOS Image Sensor Monitor publication. Pierre has an engineering degree from Universite de Technologie de Compiegne, and MSc from Virginia Tech, and an MBA from Grenoble Ecole de Management.